Mumbai:
The Indian Institute of Technology (IIT) Bombay on Tuesday announced a strategic partnership with IT services firm Tata Consultancy Services (TCS) to develop India's first Quantum Diamond microchip imager – an advanced sensing tool to test the quality of semiconductor chips.
The new sensor instrument, which will be built at the IIT Bombay PQuest Lab by experts from TCS over the next two years, will help reduce the chances of chip failure and improve the efficiency of electronic devices.
It will enable better quality control of semiconductor chips, improving product reliability, safety and energy efficiency of electrical appliances.
“IIT Bombay's PQuest group is excited to collaborate with TCS to develop a quantum imaging platform for the non-destructive testing of chips, leveraging our extensive expertise in quantum sensors to drive innovation. By working together, we aim to transform several sectors, including electronics and healthcare, and move India forward with breakthrough technologies and products,” said Dr. Kasturi Saha, Associate Professor, Department of Electrical Engineering, IIT Bombay.
The collaboration between TCS and IIT Bombay is in line with the National Quantum Mission – a government initiative to position the nation as a global leader in quantum technology.
An indigenous Quantum Diamond microchip imager that integrates quantum diamond microscopy with AI/ML-powered software imaging will help India leapfrog the quantum revolution.
“The Second Quantum Revolution is advancing at unprecedented speed, making it imperative to combine our resources and expertise to build breakthrough capabilities in sensing, computing and communications technologies,” said Harrick Vin, Chief Technology Officer from TCS.
As semiconductors continue to shrink, traditional detection methods lack the precision and capabilities to detect anomalies in the chips.
The Quantum Diamond microchip imager uses the defects in a diamond's structure, known as Nitrogen-Vacancy (NV) centers, along with the other hardware and software to detect and characterize anomalies in semiconductor chips.
It will have broad applications in areas including microelectronics, biological and geological imaging and fine-scale magnetic field imaging.
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